Jiaqi Liu
- Masterstudent
- Metrology Exploration of Patterned Nano-features in Extreme Ultraviolet Lithography (EUVL)
- Betreuung:
Prof. Dr. rer. nat. Uli Lemmer
Prof. Stefan De Gendt, KU Leuven
Prof. Dr. rer. nat. Uli Lemmer
Prof. Stefan De Gendt, KU Leuven